Classification Details
| Category | 3 — Electronics |
| Product Group | B — Test, Inspection & Production Equipment |
| Description | Test or inspection equipment "specially designed" for testing or inspecting finished or unfinished semiconductor devices as follows (see List of Items Controlled) and "specially designed" "components" and "accessories" therefor. |
| Control Reasons | ATNSRS |
| License Exceptions | GBSLVS |
Items Controlled
a. For testing S-parameters of items specified by 3A001.b.3. b. For testing microwave integrated circuits controlled by 3A001.b.2. c. Inspection equipment designed for "EUV" mask blanks or "EUV" patterned masks.
Related Controls
See also 3A999.a, 3B992, and 3B993.
Items may also be controlled under the ITAR (22 CFR 121) administered by the State Department Directorate of Defense Trade Controls (DDTC).
Related ECCNs
Export Control Context
Category 3 covers electronics including integrated circuits, semiconductor devices, and signal processing equipment. This is one of the largest categories on the CCL. 3A001 (electronic components) and related ECCNs are frequently encountered in semiconductor and advanced manufacturing supply chains.
Source: BIS Commerce Control List, eCFR Title 15 Part 774. This reference is for informational purposes only. For licensing determinations, consult BIS.doc.gov or a licensed export compliance attorney.
Cross-Source Intelligence
CSL Entities
1043
Related Export Codes (Schedule B)
Sources: BIS Commerce Control List (eCFR), Census Schedule B, BIS Consolidated Screening List