Classification Details
| Category | 3 — Electronics |
| Product Group | B — Test, Inspection & Production Equipment |
| Description | Scanning Electron Microscope (SEM) equipment designed for imaging semiconductor devices or integrated circuits, having all of the following (See List of Items Controlled). |
| Control Reasons | ATNSRS |
| License Exceptions | GBSLVSSTA |
Related ECCNs
Export Control Context
Category 3 covers electronics including integrated circuits, semiconductor devices, and signal processing equipment. This is one of the largest categories on the CCL. 3A001 (electronic components) and related ECCNs are frequently encountered in semiconductor and advanced manufacturing supply chains.
Source: BIS Commerce Control List, eCFR Title 15 Part 774. This reference is for informational purposes only. For licensing determinations, consult BIS.doc.gov or a licensed export compliance attorney.
Cross-Source Intelligence
Fed Reg Amendments
5
CSL Entities
1044
Recent BIS Amendments
Commerce Control List Additions and Revisions; Implementation of Controls on Advanced Technologies Consistent With Controls Implemented by International Partners
Commerce Control List Additions and Revisions; Implementation of Controls on Advanced Technologies Consistent With Controls Implemented by International Partners; Correction
Foreign-Produced Direct Product Rule Additions, and Refinements to Controls for Advanced Computing and Semiconductor Manufacturing Items
Controls on Certain Laboratory Equipment and Related Technology To Address Dual Use Concerns About Biotechnology
Implementation of Additional Due Diligence Measures for Advanced Computing Integrated Circuits; Amendments and Clarifications; and Extension of Comment Period
Related Export Codes (Schedule B)
Sources: BIS Commerce Control List (eCFR), Census Schedule B, Federal Register (BIS), BIS Consolidated Screening List