Classification Details
| Category | 3 — Electronics |
| Product Group | A — Systems, Equipment & Components |
| Description | Mass spectrometers, capable of measuring ions of 230 u or greater and having a resolution of better than 2 parts in 230, and ion sources therefor, excluding items that are subject to the export licensing authority of the Nuclear Regulatory Commission (see 10 CFR part 110). |
| Control Reasons | ATNP |
| License Exceptions | GBSLVS |
Items Controlled
a. Inductively coupled plasma mass spectrometers (ICP/MS); b. Glow discharge mass spectrometers (GDMS); c. Thermal ionization mass spectrometers (TIMS); d. Electron bombardment mass spectrometers having both of the following features: d.1. A molecular beam inlet system that injects a collimated beam of analyte molecules into a region of the ion source where the molecules are ionized by an electron beam;
Related Controls
(1) See ECCNs 3E001 ("development" and "production") and 3E201 ("use") for technology for items controlled under this entry. (2) Mass spectrometers "specially designed" or prepared for analyzing on-line samples of UF 6 gas streams are subject to the export licensing authority of the Nuclear Regulatory Commission (see 10 CFR part 110).
Items may also be controlled under the ITAR (22 CFR 121) administered by the State Department Directorate of Defense Trade Controls (DDTC).
Related ECCNs
Export Control Context
Category 3 covers electronics including integrated circuits, semiconductor devices, and signal processing equipment. This is one of the largest categories on the CCL. 3A001 (electronic components) and related ECCNs are frequently encountered in semiconductor and advanced manufacturing supply chains.
Source: BIS Commerce Control List, eCFR Title 15 Part 774. This reference is for informational purposes only. For licensing determinations, consult BIS.doc.gov or a licensed export compliance attorney.
Cross-Source Intelligence
CSL Entities
1043
Related Export Codes (Schedule B)
Sources: BIS Commerce Control List (eCFR), Census Schedule B, BIS Consolidated Screening List