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Schedule B 9031.41.00.00Chapter 90

Schedule B 9031.41.00.00 — OPTICAL INSTRUMENTS FOR INSPECTING SEMICONDUCTOR WAFERS OR DEVICES OR FOR INSPECTING PHOTOMASKS OR RETICLES USED IN MANUFG SEMICONDUCTOR DEVICES

Optical, Photographic, Medical Instruments · Unit: NO · HTS match found · Census Bureau

Classification Details

Schedule B Code

9031.41.00.00

Unit of Quantity

NO

Description

OPTICAL INSTRUMENTS FOR INSPECTING SEMICONDUCTOR WAFERS OR DEVICES OR FOR INSPECTING PHOTOMASKS OR RETICLES USED IN MANUFG SEMICONDUCTOR DEVICES

Export Control Classification

Probable ECCN — Export license may be required

Heuristic only — verify with BIS before exporting.

6A0017A001

Data compiled from Census Schedule B, BIS Commerce Control List (eCFR) · Heuristic mapping · Verify with BIS

Matching US Import Code (HTS)

HTS 9031.41.00Duty: Free

For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits)

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