Optical, Photographic, Medical Instruments · 15 pending regulations · 15 court cases · $534.6M monthly imports · 100% from 1 countries · Updated daily from USITC
General
Free
Special
Free
Column 2
Free
Trade Agreement Eligibility
Monthly Imports
$534.6M
2026-01
Trade Concentration
100%
from top 3 of 1 origins
Regulatory Pressure
HIGH
0 rulings — · 15 reg · 10 CIT, 5 CAFC (4 recent)
Global Rates
🇺🇸 Free
🇬🇧 United Kingdom: N/A · 🇪🇺 European Union: N/A · 🇨🇦 Canada: N/A · 🇧🇷 Brazil: N/A
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Data compiled from USITC HTS, US Census Bureau, Federal Register, CourtListener · As of 2026-04-29 · Updates monthly
This code has elevated regulatory activity — 0 CBP rulings (0 in last 2 years, trend: stable), 15 pending Federal Register actions, and 15 CIT/CAFC cases.
100% of US imports for this code come from just 1 countries. High origin concentration increases exposure to trade disruptions or tariff escalations.
This is a high-volume import code — $535M in monthly US imports. Duty rate changes or trade remedy actions on this code have significant economic impact.
List 1 — ~$34B of Chinese goods (machinery, electronics, industrial components)
Active — 7.5%–25% additional duties on Chinese-origin goods across four tranches (Lists 1–4A), with higher 2024/2025 increases on targeted product categories.
Effective 2018-07-06
These additional tariffs apply on top of the general duty rate. View full trade remedy tracker →
| Code | Description | Rate |
|---|---|---|
| 9031.10.00.00 | Machines for balancing mechanical parts | Free |
| 9031.20.00.00 | Test benches | 1.7% |
| 9031.41.00 | For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) | Free |
| 9031.41.00.20 | For inspecting photomasks or reticles used in manufacturing semiconductor devices | — |
| 9031.41.00.40 | For wafers | — |
| 9031.41.00.60 | Other | — |
| 9031.49 | Other: | — |
| 9031.49.10.00 | Profile projectors | Free |
| 9031.49.40.00 | Coordinate-measuring machines | Free |
| 9031.49.70.00 | For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices | Free |
| 9031.49.90.00 | Other | Free |
| 9031.80 | Other instruments, appliances and machines: | — |
| 9031.80.40.00 | Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles | Free |
| 9031.80.80 | Other | Free |
| 9031.80.80.60 | For testing electrical characteristics | — |
| 9031.80.80.70 | Other | — |
| 9031.80.80.85 | Other | — |
| 9031.90 | Parts and accessories: | — |
| 9031.90.21.00 | Of profile projectors | Free |
| 9031.90.45.00 | Bases and frames for the coordinate-measuring machines of subheading 9031.49.40 | Free |
| 9031.90.54.00 | Of optical instruments and appliances of subheading 9031.41 or 9031.49.70 | Free |
| 9031.90.59.00 | Other | Free |
| 9031.90.70.00 | Of articles of subheading 9031.80.40 | Free |
| 9031.90.91 | Other | Free |
| 9031.90.91.30 | Of machines for balancing mechanical parts | — |
| 9031.90.91.60 | Of test benches | — |
| 9031.90.91.95 | Other | — |
Guidance for Grants and Agreements
Final rule; notification of final guidance.·Effective 2023-10-23
Final rule.·Effective 2021-11-04
Proposed rule.
Proposed rule.
MACHINES FOR BALANCING MECHANICAL PARTS
Census Bureau export classification matching this HTS import code.
